TESCAN CLARA for Materials Science
Field-free analytical UHR SEM for materials characterization at the nanoscale.
The TESCAN CLARA UHR-SEM system is a scanning electron microscope (SEM) that meets the demands for high-quality images and microanalysis that regularly arise in various fields of research and technology.
TESCAN CLARA is powered by the TESCAN BrightBeam™ SEM column technology, which makes use of an integrated electrostatic-magnetic objective. This offers ultra-high-resolution abilities at low accelerating voltages in a field-free fashion—a crucial feature for no-compromise imaging of all types of samples, for example, those that are magnetic.
TESCAN CLARA is equipped with a special in-column multidetector system that enables preferable collection of electrons as per their take-off angle and energy. This leads to optimum topographic and compositional data from the sample. Equipped with a filtering grid, the multidetector provides access to filter BSE and SE energies selectively and improves materials contrast and the capability to live-switch between BSE and SE signal.
The axial detector, which is the second in-column detector, has been developed to gather SE signal at optimum efficiency and any landing voltages without tangible loss of SE signal. This renders UHR-SE observation very simple and regular, even at low landing voltages.
Moreover, TESCAN CLARA can be fitted with two In-chamber detectors and an E-T detector as a standard, to offer very high signal and topographical contrast from the sample. The optional retractable low energy BSE detector gathers wide-angle BSEs and offers high-material contrast, even at low accelerating voltages.
TESCAN CLARA is a truly flexible instrument and is perfect for the characterization of nanomaterials, severe quality control in the high-end manufacturing industry, as well as for Research and Development.
![TESCAN CLARA for Materials Science](https://www.prima-instrument.co.id/wp-content/uploads/2023/01/TESCAN-CLARA-for-Materials-Science-1024x683.jpg)
Field-free analytical UHR SEM for materials characterization at the nanoscale.
The TESCAN CLARA UHR-SEM system is a scanning electron microscope (SEM) that meets the demands for high-quality images and microanalysis that regularly arise in various fields of research and technology.
TESCAN CLARA is powered by the TESCAN BrightBeam™ SEM column technology, which makes use of an integrated electrostatic-magnetic objective. This offers ultra-high-resolution abilities at low accelerating voltages in a field-free fashion—a crucial feature for no-compromise imaging of all types of samples, for example, those that are magnetic.
TESCAN CLARA is equipped with a special in-column multidetector system that enables preferable collection of electrons as per their take-off angle and energy. This leads to optimum topographic and compositional data from the sample. Equipped with a filtering grid, the multidetector provides access to filter BSE and SE energies selectively and improves materials contrast and the capability to live-switch between BSE and SE signal.
The axial detector, which is the second in-column detector, has been developed to gather SE signal at optimum efficiency and any landing voltages without tangible loss of SE signal. This renders UHR-SE observation very simple and regular, even at low landing voltages.
Moreover, TESCAN CLARA can be fitted with two In-chamber detectors and an E-T detector as a standard, to offer very high signal and topographical contrast from the sample. The optional retractable low energy BSE detector gathers wide-angle BSEs and offers high-material contrast, even at low accelerating voltages.
TESCAN CLARA is a truly flexible instrument and is perfect for the characterization of nanomaterials, severe quality control in the high-end manufacturing industry, as well as for Research and Development.
Key Benefits SEM TESCAN CLARA for Materials Science
- Uncompromised characterization of all types of materials at the nanoscale
- Ideal for characterization of materials at low beam energies for maximum surface topography
- Excellent imaging of beam-sensitive and non-conductive samples
- Fully automated setup of electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™
- Intuitive live SEM navigation on the sample at magnification as low as 2× without the need of an extra optical navigation camera thanks to the Wide Field Optics™ design
- Unique In-Beam Multidetector design allowing angle and energy selective BSE detection
- Intuitive software modular platform designed for effortless operation regardless of users’ skill level
![](https://www.prima-instrument.co.id/wp-content/uploads/2023/01/SEM-TESCAN-CLARA-for-Materials-Science.jpg)
Feature of SEM TESCAN CLARA for Materials Science
More Information
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