TESCAN CLARA for Materials Science
Field-free analytical UHR SEM for materials characterization at the nanoscale.
The TESCAN CLARA UHR-SEM system is a scanning electron microscope (SEM) that meets the demands for high-quality images and microanalysis that regularly arise in various fields of research and technology.
TESCAN CLARA is powered by the TESCAN BrightBeam™ SEM column technology, which makes use of an integrated electrostatic-magnetic objective. This offers ultra-high-resolution abilities at low accelerating voltages in a field-free fashion—a crucial feature for no-compromise imaging of all types of samples, for example, those that are magnetic.
TESCAN CLARA is equipped with a special in-column multidetector system that enables preferable collection of electrons as per their take-off angle and energy. This leads to optimum topographic and compositional data from the sample. Equipped with a filtering grid, the multidetector provides access to filter BSE and SE energies selectively and improves materials contrast and the capability to live-switch between BSE and SE signal.
The axial detector, which is the second in-column detector, has been developed to gather SE signal at optimum efficiency and any landing voltages without tangible loss of SE signal. This renders UHR-SE observation very simple and regular, even at low landing voltages.
Moreover, TESCAN CLARA can be fitted with two In-chamber detectors and an E-T detector as a standard, to offer very high signal and topographical contrast from the sample. The optional retractable low energy BSE detector gathers wide-angle BSEs and offers high-material contrast, even at low accelerating voltages.
TESCAN CLARA is a truly flexible instrument and is perfect for the characterization of nanomaterials, severe quality control in the high-end manufacturing industry, as well as for Research and Development.
Field-free analytical UHR SEM for materials characterization at the nanoscale.
The TESCAN CLARA UHR-SEM system is a scanning electron microscope (SEM) that meets the demands for high-quality images and microanalysis that regularly arise in various fields of research and technology.
TESCAN CLARA is powered by the TESCAN BrightBeam™ SEM column technology, which makes use of an integrated electrostatic-magnetic objective. This offers ultra-high-resolution abilities at low accelerating voltages in a field-free fashion—a crucial feature for no-compromise imaging of all types of samples, for example, those that are magnetic.
TESCAN CLARA is equipped with a special in-column multidetector system that enables preferable collection of electrons as per their take-off angle and energy. This leads to optimum topographic and compositional data from the sample. Equipped with a filtering grid, the multidetector provides access to filter BSE and SE energies selectively and improves materials contrast and the capability to live-switch between BSE and SE signal.
The axial detector, which is the second in-column detector, has been developed to gather SE signal at optimum efficiency and any landing voltages without tangible loss of SE signal. This renders UHR-SE observation very simple and regular, even at low landing voltages.
Moreover, TESCAN CLARA can be fitted with two In-chamber detectors and an E-T detector as a standard, to offer very high signal and topographical contrast from the sample. The optional retractable low energy BSE detector gathers wide-angle BSEs and offers high-material contrast, even at low accelerating voltages.
TESCAN CLARA is a truly flexible instrument and is perfect for the characterization of nanomaterials, severe quality control in the high-end manufacturing industry, as well as for Research and Development.
Key Benefits SEM TESCAN CLARA for Materials Science
- Uncompromised characterization of all types of materials at the nanoscale
- Ideal for characterization of materials at low beam energies for maximum surface topography
- Excellent imaging of beam-sensitive and non-conductive samples
- Fully automated setup of electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™
- Intuitive live SEM navigation on the sample at magnification as low as 2× without the need of an extra optical navigation camera thanks to the Wide Field Optics™ design
- Unique In-Beam Multidetector design allowing angle and energy selective BSE detection
- Intuitive software modular platform designed for effortless operation regardless of users’ skill level
Feature of SEM TESCAN CLARA for Materials Science
Ti Nanotubes
Nanoporous gold on Si
Interlamellar spacing in perlite of cast iron
More Information
Get more technical information for this Scanning Electrone Microscope (SEM) for Material Science here!
