TESCAN MAGNA for Materials Science
UHR SEM for nanomaterials characterization at sub-nanometer scale.
TESCAN MAGNA is a sum up of Ultra-high resolution and high-contrast imaging of next-gen materials with a unique TriBE™ and TriSE™ In-Beam detection for advanced nano characterization.
Rest assure that optimal imaging and analytical conditions guaranteed by TESCAN In-Flight Beam Tracing™.
MAGNA is unique for TriSE™ detection, TriBE™ detection, BSE’s selective energy filtering, Precise nanometer scale studies (SEM/STEM) of material structures and UHR imaging of delicate ultra-thin brain sections with low keV backscattered electrons.
UHR SEM for nanomaterials characterization at sub-nanometer scale.
TESCAN MAGNA is a sum up of Ultra-high resolution and high-contrast imaging of next-gen materials with a unique TriBE™ and TriSE™ In-Beam detection for advanced nano characterization.
Rest assure that optimal imaging and analytical conditions guaranteed by TESCAN In-Flight Beam Tracing™.
MAGNA is unique for TriSE™ detection, TriBE™ detection, BSE’s selective energy filtering, Precise nanometer scale studies (SEM/STEM) of material structures and UHR imaging of delicate ultra-thin brain sections with low keV backscattered electrons.
Key Benefits SEM TESCAN MAGNA for Materials Science
High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures)
Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale
Fast setup of the electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™
Multi-detector system TriBE™ and TriSE™ for sample nanocharacterization
Intuitive software modular platform designed for effortless operation regardless users’ skill level
Feature of SEM TESCAN MAGNA for Materials Science
More Information
Get more technical information for this Scanning Electrone Microscope (SEM) for Material Science here!