TESCAN VEGA Compact for Materials Science

Compact analytical SEM (Scanning Electron Microscope) for routine materials characterization, research and quality control applications at the micron scale.

Proving that entry-level doesn’t have to mean compromising on results, TESCAN VEGA Compact offers a complete analytical SEM solution for laboratories that place a priority on both easy operation and quick time to high quality images and compositional (EDS) analysis.

TESCAN VEGA Compact features a simplified configuration that includes only the most critical components for efficiently capturing morphological and elemental data, allowing TESCAN VEGA Compact to occupy a smaller footprint in the lab. With the ability to accommodate large-sized samples that are common in industry, materials science and semiconductors — like metallurgical cross-sections, welded structures, or printed circuit boards – TESCAN VEGA Compact is a great choice for not only your current materials inspection, quality control and failure analysis needs, but also your future analytical needs.

TESCAN VEGA Compact operates from TESCAN’s own full-featured graphical user interface, TESCAN Essence™, which is at the heart of all TESCAN SEM and FIB-SEM instruments. An operator who learns on TESCAN VEGA Compact can easily make the transition to other TESCAN microscopes or adapt some features of the Essence software environment to match the GUI of other instruments in the lab.

Compact analytical SEM (Scanning Electron Microscope) for routine materials characterization, research and quality control applications at the micron scale.

Key Benefits SEM TESCAN VEGA for Materials Science

Process samples faster with VEGA Compact’s large chamber, which offers the space for analyzing multiple samples or large samples, as well as true high vacuum for dependable EDS results
Easily acquire compositional data and directly correlate it to the SEM image using the overlay feature of TESCAN’s optional, fully integrated Essence™ EDS
Set-up beam parameters quickly for optimal imaging and analytical conditions with TESCAN´s In-Flight Beam Tracing™
Navigate effortlessly and precisely – at magnifications as low as 2x – with TESCAN´s unique Wide Field Optics™ mode, which eliminates the need for an additional optical camera
Move samples confidently and avoid collisions using TESCAN’s unique live 3D collision model which replicates the size and geometry of samples and detectors within the chamber interior
Customize the GUI to match a user‘s experience level and application for intuitive operation of TESCAN´s Essence™ microscope control software
Save cost and reduce your ecological footprint using TESCAN’S optional vacuum buffer that significantly reduces vacuum rotary pump run-time

Feature of SEM TESCAN VEGA for Materials Science

Graphic card overview image captured using the Wide-Field Mode™

Fractured metal surface captured using SE detector at 5 keV accelerating voltage

Detail of the fractured ceramic surface captured with SE detector at 10 keV accelerating voltage

Distribution of Si (blue), Cu (purple) and C (green)in ancient plaster identified by Essence™ EDS in the live scanning window of the VEGA Compact SEM

The microstructure of AlCuPbMg alloy containing alpha phase-grains with visible Cu-rich precipitates imaged at 7 keV with BSE detector

Crystals which grew on the surface of the turbine-blade from Ni-base superalloy after the exposure to working conditions at high temperatures (imaged at 10 keV with SE detector)

Adhesion of the thermal-spray coating based on hard-particles mixed with metallic matrix imaged at 30 keV with BSE detector

Ductile fracture of metal specimen after the sharpy V test imaged at 20 keV with SE detector

SEM VEGA Compact alternatives to tabletop systems

VEGA Compact offers ease of use and an outstanding price–performance ratio which makes it best choice when considering alternatives to tabletop systems

VEGA Compact is rich in features that deliver great value for common sample characterization workflows. The advantages become more evident when comparing the imaging and analysis features of VEGA Compact to those of a tabletop system. For a more detailed comparison.

	Key features valued in SEM materials characterization	TableTop	VEGA Compact
Larger chamber size with 5-axis compucentric fully motorized stage	Take advantage of more choices for investigating samples of varying size, form and type. The larger chamber and stage can handle multiple standard stubs; several polished cross-sectional samples, or complex samples like welded parts, can be inserted together and analyzed without need for their manual readjustment.	?	Yes
High resolution and magnification up to 1,000,000x	Reveal details down to the range of few nanometers and obtain maximum image quality with a magnification range that will serve both your current and future sample characterization demands.	?	Yes
Accelerating voltage down to 200 eV and up to 30 keV	Reveal the finest topographic details by using a low accelerating voltage, which guarantees maximum surface information from your samples. Or obtain accurate EDS analysis of heavy elements requiring 30 keV accelerating voltage. A broad voltage range means more freedom in characterization.	?	Yes
Two standard detectors: SE and four quadrant BSE	Obtain proper topographic and elemental contrast information from a single area on your samples with an acquisition scan using simultaneous secondary electron (SE) and four quadrant backscattered electron (BSE) detection.	?	Yes